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Probe-Type Electrical Characteristics Inspection Device
Cost reduction with economical parts and design time reduction, quality assurance, cost reduction

Specifications and Features
Purpose/Function
Inspection/Measurement

Moves workpieces supplied by a robot onto two workpiece tables and positions the probe holder for inspection.
Widely applied to conduction tests and line tests of electronic circuits in the semiconductor industry.
Probe-Type Electrical Characteristics Inspection Device
※ This example is for design reference only. Equipment components may differ from the actual shape.
No. Component Economy Type Number Specification Quantity Unit Price
Angle Plate C-AIKK200-100 Height: 200mm
Length: 60mm
1 MYR 193.97/Unit
Proximity Sensor C-2C08-N11 Output type: NPN (normally open)
Detection distance: 4.0mm
Sensor head specification: M8×1.0mm
2 MYR 61.42/Unit
Contact Probe C-NP58-C Probe head shape: A type
Probe head outer diameter: 0.8mm
2 MYR 103.28/Unit
Actuator C-KS4001-B1-100-F0 Cover: None
Base length: 100mm
Stage long block: 1 piece
Motor accessory: F0
1 MYR 1,200.84/Unit
※ Kindly check MISUMI eCatalog for latest information.
※ The price on the product list is the starting price for that product.
    Product details (Price, leadtime and availability) may be subjected to updates.
    Kindly check MISUMI eCatalog for latest information.