Comparison of specifications and performance between Misumi products and marketed products*

Items	Misumi existing products	Misumi economic type	Marketed products*
Material	Brass	Phosphor bronze	Copper nickel alloy
Head surface treatment	Rhodium plating	Gold plating	Nickel plating
Usage life	300,000 times	100,000	50,000~80,000 times

Wear resistance comparison

Probe head 100,000 times durability test

Market distribution*

Severe wear condition

Misumi economy type

Slight wear

Comparison of load and electrical conductivity

• Misumi's rhodium-plated and gold-plated products show no significant change in load and resistance values ​​even after 200,000 uses.
• Misumi products have excellent electrical conductivity and very stable resistance values ​​compared to nickel-plated products on the market due to gold plating.

Load measurement results

Load (average), unit: N

Durability test	Initial value	10,000 times	50,000 times	100,000 times	200,000 times
Rhodium plating	1.873	1.890	1.898	1.908	1.957
Gold plating	1.936	2.043	2.083	2.044	1.986

Resistance value measurement results

Resistance value (average), unit: mΩ

Durability Test Test	Initial Value	10,000 times	50,000 times	100,000 times	200,000 times
Rhodium plating	37.92	51.91	50.34	66.70	55.65
Gold plating	29.53	31.14	30.40	31.95	33.61

※ Market distribution products are similar products that we purchased randomly from online and offline markets.
※ Experimental data is obtained through our inspection and measurement and is provided for reference only.

ICT Test Probe

Test probes are widely used in the testing field of semiconductors (IC) and printed circuit boards (PCB), and the probe is mounted inside a socket or jig. The socket or jig is mounted between the measured object and the test board, and the probe is connected to the measured object and the test board to transmit a certain current and frequency to determine whether the measured object passes or fails.

How to use

IC test probe

A spring probe is used to test the performance of semiconductor ICs. The upper head of the probe is contacted with the IC measurement point (Pad, Ball, etc.), and the lower pin is contacted with the measurement board to transmit a certain current and frequency to determine whether the measurement object is qualified.

Printed circuit board (PCB) inspection probe

The printed circuit board (PCB) probe is generally assembled with a bush and used to test the continuity of the circuit board. It is also used to test the actual board (ICT/FCT) to which the components are connected.